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美国进口关税

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中国原产 → 美国 · 2026-09-08(UTC) · 你填写的

默认中国原产,可修改。引擎按当前 UTC 日期及当前资料查询;不提供历史税则回放或未来预测。

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原文保留在输入框中。修正优先于提取;不确定的事实不会视为“否”。

选择符合商品的美国 HTS

请核对各条目的商品范围、材质与用途。排序不代表已经归类。

  • 9031.10.00.00

    平衡机械零件的机器

    事实不足,待确认
    待确认:当前条目与已核对资料版本或完整路径不一致,判别条件待重新核实

    机器翻译,未审校,以英文原文为准。
    上级范围与英文依据

    Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: · Machines for balancing mechanical parts

    Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: · Machines for balancing mechanical parts

    税号资料 ↗
  • 9031.20.00.00

    试验台

    事实不足,待确认
    待确认:当前条目与已核对资料版本或完整路径不一致,判别条件待重新核实

    机器翻译,未审校,以英文原文为准。
    上级范围与英文依据

    Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: · Test benches

    Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: · Test benches

    税号资料 ↗
  • 9031.41.00

    用于检验半导体晶圆或器件(包括集成电路)或用于检验制造半导体器件(包括集成电路)所使用的光掩模或掩模版

    事实不足,待确认
    待确认:当前条目与已核对资料版本或完整路径不一致,判别条件待重新核实

    上级范围与英文依据

    Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: · Other optical instruments and appliances: · For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)

    Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: · Other optical instruments and appliances: · For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)

    税号资料 ↗
  • 9031.49

    Other optical instruments and appliances: — 其他:

    事实不足,待确认
    待确认:当前条目与已核对资料版本或完整路径不一致,判别条件待重新核实

    上级范围与英文依据

    Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: · Other optical instruments and appliances: · Other:

    Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: · Other optical instruments and appliances: · Other:

    税号资料 ↗
  • 9031.80

    其他仪器、器具及机器:

    事实不足,待确认
    待确认:当前条目与已核对资料版本或完整路径不一致,判别条件待重新核实

    上级范围与英文依据

    Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: · Other instruments, appliances and machines:

    Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: · Other instruments, appliances and machines:

    税号资料 ↗
  • 9031.90

    零件及附件:

    事实不足,待确认
    待确认:当前条目与已核对资料版本或完整路径不一致,判别条件待重新核实

    上级范围与英文依据

    Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: · Parts and accessories:

    Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: · Parts and accessories:

    税号资料 ↗

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